Module 3B2 - Integrated Digital Electronics

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Contents

Laboratory Sessions (information for demonstrators)

The Part IIA Laboratory for Module 3B2  runs in the Electrical and Information Teaching Laboratory (first floor of the Inglis Building). The Chief Technician is Mr Dave Gautrey; the Lab telephone number is: extension 32728. The lab is open from approximately 8 a.m. to 6 p.m. Monday to Friday.

The Part IIA Laboratory Sessions are scheduled at designated times during Full Term (see below), in the Lent Term only. Students may need to return to the lab in the afternoon to complete an experiment; the equipment is also available during the lunch hour; but note that demonstrators are in attendance during the morning session only.

Two experiments are provided, and details are given below.  Please note that the Teaching Office requires that each student carries out only one experiment; in most modules this is achieved by limiting the provision of experiments to one per module.  For 3B2, although two experiments are currently set up, the same applies and students may submit only one report for marking.  In an extension to the normal Teaching Office rules, students may if they wish undertake the second experiment for interest's sake, but may not submit a report for marking.  The lab staff have been asked to monitor the submission of reports and ensure that the submission of reports is in accordance with the rules.

Wednesday 11.00 to 13.00, with continuation into the afternoon if required
Friday 11.00 to 13.00, with continuation into the afternoon if required

Demonstrating Schedules (login needed) 2013/2014

Summary of Experiments

Experiment A - Logic Analysers

Objectives

  1. To become familiar with a typical Logic Analyser, learn its features and have practice at using it.
  2. To examine and make measurements on the 8 line output of a random sequence generator and on the clock that drives it.
  3. To examine and make measurements on the 16 lines of the IEEE-488 bus between a PC and a DVM while the meter is being set to different ranges and readings are being taken from it.
NameSizeLast write dateNotes
3B2-Expt-A-Rev-14.pdf 624 KB04-01-2014

This version is for 2014

3B2-Expt-A-Table.pdf12 KB 04-01-2013

Table for completion

3B2-Expt-A-LA3200-pages.pdf

3,197 KB11-01-2012

Excerpts from LA3200 manual (25 sides)

To refer to the complete LA3200 manual, point your browser at this link 

Experiment B - Digital Circuits

Objectives

  1. To interpret data sheets supplied by digital IC manufacturers and to use the data in a design exercise.
  2. To make measurements on NAND gates from two different technologies; to compare logic output levels, propagation delays and power consumption.
  3. To investigate how power-delay products for each of these technologies varies with switching frequency.
  4. To gain experience in using oscilloscope probes with a 100 MHz oscilloscope to make accurate measurements down to a few nanoseconds.
  5. To assemble and test a simple system using digital ICs.
  6. To record the system waveforms.
NameSizeLast write dateNotes
3B2-Expt-B-Rev-14.pdf 243 KB10-01-2014 This version is for 2014
3B2-Expt-B-logic.pdf834 KB
3B2-Expt-B-handover.doc28 KB02-03-2005 15:13Demonstrator's handover notes

Full Technical Reports

NameSizeLast write dateNotes
3B2-Expt-A-FTR-2014.pdf 267 KB10-01-2014 Updated for 2014
3B2-Expt-B-FTR-2014.pdf 263 KB10-01-2014 Updated for 2014

Notes, additions and corrections 

Useful web resources 

Useful articles 

General notes for Demonstrators

NameSizeLast write dateNotes
3B2-Expt-A-Demo-Notes.pdf7-01-2011Demonstrator Access Only
3B2-Expt-B-Demo-Notes.pdf7-01-2011Demonstrator Access Only

Updated 26 January, 2014

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